Optical device and method of manufacturing the same

ABSTRACT

An optical device includes a first circuit layer, a light detector, a first conductive pillar and an encapsulant. The first circuit layer has an interconnection layer and a dielectric layer. The light detector is disposed on the first circuit layer. The light detector has a light detecting area facing away from the first circuit layer and a backside surface facing the first circuit layer. The first conductive pillar is disposed on the first circuit layer and spaced apart from the light detector. The first conductive pillar is electrically connected to the interconnection layer of the first circuit layer. The encapsulant is disposed on the first circuit layer and covers the light detector and the first conductive pillar. The light detector is electrically connected to the interconnection layer of the first circuit layer through the first conductive pillar. The backside surface of the light detector is exposed from the encapsulant.

BACKGROUND 1. Technical Field

The present disclosure relates to an optical device, and more particularly, to an optical device including a fan-out structure.

2. Description of the Related Art

Optical devices are used in many applications (e.g., image sensor, proximity sensor or the like). An optical device may include various electronic components, such as a light emitter, a light detector, a controller and/or processor. Those electronic components are disposed on a substrate and electrically connected to the substrate by wire bonding technique. However, the substrate has a relatively large area and thickness. In addition, an additional space and height are included for wire bonding loops, and this would hinder the miniaturization of the optical device.

SUMMARY

In some embodiments, an optical device includes a first circuit layer, a light detector, a first conductive pillar and an encapsulant. The first circuit layer has an interconnection layer and a dielectric layer. The light detector is disposed on the first circuit layer. The light detector has a light detecting area facing away from the first circuit layer and a backside surface facing the first circuit layer. The first conductive pillar is disposed on the first circuit layer and spaced apart from the light detector. The first conductive pillar is electrically connected to the interconnection layer of the first circuit layer. The encapsulant is disposed on the first circuit layer and covers the light detector and the first conductive pillar. The light detector is electrically connected to the interconnection layer of the first circuit layer through the first conductive pillar. The backside surface of the light detector is exposed from the encapsulant.

In some embodiments, an optical device includes a circuit layer, a light detector, a controller and an encapsulant. The circuit layer has an interconnection layer and a first dielectric layer. The light detector is disposed on the circuit layer and electrically connected to the interconnect layer of the circuit layer. The light detector has an active surface facing the circuit layer and a backside surface opposite to the active surface. The light detector has a light detecting area adjacent to the active surface. The controller has an active surface facing away from the circuit layer and a backside surface disposed on the backside surface of the light detector. The encapsulant is disposed on the circuit layer and covers the light detector and the controller.

In some embodiments, a method for manufacturing an optical device includes (a) forming a first circuit layer; (b) attaching a backside surface of a light detector to the first circuit layer, the light detector having a light detecting area facing away from circuit layer; (c) disposing a first protection film on the light detecting area of the light detector; (d) forming an encapsulant on the first circuit layer to cover the light detector; and (e) removing the first protection film to expose the light detecting area of the light detector.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of some embodiments of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is noted that various structures may not be drawn to scale, and dimensions of the various structures may be arbitrarily increased or reduced for clarity of discussion.

FIG. 1 illustrates a cross-sectional view of an optical device in accordance with some embodiments of the present disclosure.

FIG. 2 illustrates a cross-sectional view of an optical device in accordance with some embodiments of the present disclosure.

FIG. 3 illustrates a cross-sectional view of an optical device in accordance with some embodiments of the present disclosure.

FIG. 4 illustrates a cross-sectional view of an optical module in accordance with some embodiments of the present disclosure.

FIG. 5 illustrates a cross-sectional view of an optical device in accordance with some embodiments of the present disclosure.

FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G illustrate a method for manufacturing an optical device in accordance with some embodiments of the present disclosure.

FIG. 7A, FIG. 7B, FIG. 7C, FIG. 7D, FIG. 7E, FIG. 7F, FIG. 7G, FIG. 7H and FIG. 7I illustrate a method for manufacturing an optical device in accordance with some embodiments of the present disclosure.

Common reference numerals are used throughout the drawings and the detailed description to indicate the same or similar components. The present disclosure can be best understood from the following detailed description taken in conjunction with the accompanying drawings.

DETAILED DESCRIPTION

FIG. 1 illustrates a cross-sectional view of an optical device 1 in accordance with some embodiments of the present disclosure. The optical device 1 includes circuit layers 10, 11, electronic components 12, 13, an encapsulant 14, conductive pillars (or posts) 15, a film 16 and electrical contacts 17.

The circuit layer 10 includes an interconnection layer (e.g., redistribution layer, RDL) 10 r and a dielectric layer 10 d. A portion of the interconnection layer 10 r is covered or encapsulated by the dielectric layer 10 d while another portion of the interconnection layer 10 r is exposed from the dielectric layer 10 d to provide electrical connections. In some embodiments, the dielectric layer 10 d may include an organic material, a solder mask, a polyimide (PI), an epoxy, an Ajinomoto build-up film (ABF), one or more molding compounds, one or more pre-impregnated composite fibers (e.g., a pre-preg fiber), a borophosphosilicate glass (BPSG), a silicon oxide, a silicon nitride, a silicon oxynitride, an undoped silicate glass (USG), any combination thereof, or the like. Examples of molding compounds may include, but are not limited to, an epoxy resin including fillers dispersed therein. Examples of a pre-preg fiber may include, but are not limited to, a multi-layer structure formed by stacking or laminating one or more pre-impregnated materials or sheets. In some embodiments, the dielectric layer 10 d may include an inorganic material, such as silicon, a ceramic or the like. In some embodiments, there may be any number of interconnection layers 10 r depending on design specifications. The circuit layer 10 has a surface 101 and a surface 102 opposite to the surface 101.

The electronic component 12 is disposed on the surface 101 of the circuit layer 10. In some embodiments, a backside surface of the electronic component 12 is attached to the surface 101 of the circuit layer 10 through an adhesion layer (e.g., die attach film, DAF) 12 d. The electronic component 12 has a light emitting area 12 e facing away from the circuit layer 10 and configured to emit a light beam toward an object. The light emitting area 12 e is located adjacent to an active surface of the electronic component 12. In some embodiments, the electronic component 12 may be a light emitter or a light emitting device, such as a light-emitting diode (LED) or other light emitting die. For example, the electronic component 12 may include, e.g., an LED, a laser diode, another device that may include one or more semiconductor layers, or a combination of two or more thereof. The semiconductor layers may include silicon, silicon carbide, gallium nitride, or any other semiconductor materials.

The electronic component 12 has conductive pads 12 c 1 and 12 c 2 (e.g., P-terminal and N-terminal) disposed on the active surface of the electronic component 12 to provide electrical connections. In some embodiments, the conductive pads 12 c 1, 12 c 2 and the light emitting area 12 e are disposed at or adjacent to the active surface of the electronic component 12. The conductive pads 12 c 1 and 12 c 2 may disposed adjacent to edges of the active surface of the electronic component 12 while the light emitting area 12 e may be disposed at or adjacent to the center of the active surface of the electronic component 12. Conductive pillars (e.g., copper pillars) 12 p 1 and 12 p 2 are respectively electrically connected to the conductive pads 12 c 1 and 12 c 2 of electronic component 12. For example, the conductive pillars 12 p 1 and 12 p 2 electrically connect the conductive pads 12 c 1 and 12 c 2 with the circuit layer 11. In some embodiments, a thickness of the conductive pad 12 c 1 is different from that of the conductive pad 12 c 2, and a height of the conductive pillar 12 p 1 is different from that of the conductive pillar 12 p 2. For example, as shown in FIG. 1, the thickness of the conductive pad 12 c 1 is greater than that of the conductive pad 12 c 2, and the height of the conductive pillar 12 p 1 is less than that of the conductive pillar 12 p 2. By providing the conductive pillars 12 p 1 and 12 p 2 to connect the conductive pads 12 c 1 and 12 c 2 with the circuit layer 11 can ensure that the connection surfaces (connection points) are located at the same plane or level.

The electronic component 13 is disposed on the surface 101 of the circuit layer 10 and spaced apart from the electronic component 12. In some embodiments, a backside surface of the electronic component 13 is attached to the surface 101 of the circuit layer 10 through a DAF 13 d. The electronic component 13 has a light detecting area 13 e facing away from the circuit layer 10 and configured to receive or detect a light beam reflected from the object. The light detecting area 13 e is located adjacent to an active surface of the electronic component 13. In some embodiments, the electronic component 13 may be a light detector which may be, e.g., a PIN diode, a photodiode, or a phototransistor. In some embodiments, the optical device 1 may act as a proximity sensor or any other sensors including a light emitting component and a light detecting component.

The electronic component 13 has conductive pads 13 c 1 and 13 c 2 disposed on the active surface of the electronic component 13 to provide electrical connections. In some embodiments, the conductive pads 13 c 1, 13 c 2 and the light detecting area 13 e are disposed at or adjacent to the active surface of the electronic component 13. The conductive pads 13 c 1 and 13 c 2 may disposed adjacent to edges of the active surface of the electronic component 13 while the light emitting area 13 e may be disposed at or adjacent to the center of the active surface of the electronic component 13. Conductive pillars (e.g., copper pillars) 13 p 1 and 13 p 2 are respectively electrically connected to the conductive pads 13 c 1 and 13 c 2 of electronic component 13. For example, the conductive pillars 13 p 1 and 13 p 2 electrically connect the conductive pads 13 c 1 and 13 c 2 with the circuit layer 11.

The encapsulant 14 is disposed on the surface 101 of the circuit layer 10 and covers the electronic components 12, 13 and the conductive pillars 15. The encapsulant 14 has openings 14 h 1 and 14 h 2 to expose the light emitting area 12 e of the electronic component 12 and the light detecting area 13 e of the electronic component 13. For example, the encapsulant 14 covers the active surfaces (including the conductive pads 12 c 1, 12 c 2, 13 c 1 and 13 c 2) of the electronic components 12 and 13 except for the light emitting area 12 e and the light detecting area 13 e. In some embodiments, the opening 14 h 1 is over the light emitting area 12 e of the electronic component 12 and has a width equal to or greater than a width of the light emitting area 12 e. In some embodiments, the opening 14 h 2 is over the light detecting area 13 e of the electronic component 13 and has a width equal to or greater than a width of the light detecting area 13 e. The encapsulant 14 is formed of or includes an opaque material or a light absorbing material to avoid the light emitted from the electronic component 12 from directly entering the light detecting area 13 e of the electronic component 13. This can mitigate or eliminate the cross-talk issue between the electronic components 12 and 13. In some embodiments, the encapsulant 14 may include optical density (OD) 4 materials, such as black molding compound.

The circuit layer 11 is disposed on the encapsulant 14. The circuit layer 11 includes an interconnection layer (e.g., RDL) 11 r and a dielectric layer 11 d. A portion of the interconnection layer 11 r is covered or encapsulated by the dielectric layer 11 d while another portion of the interconnection layer 11 r is exposed from the dielectric layer 11 d to provide electrical connections. For example, the interconnection layer 11 r exposed from the dielectric layer 11 d is electrically connected to the electronic components 12 and 13 through the conductive pillars 12 p 1, 12 p 2, 13 p 1 and 13 p 2. For example, the interconnection layer 11 r exposed from the dielectric layer 11 d is electrically connected to the circuit layer 10 (e.g., to the interconnection layer 10 r of the circuit layer 10) through the conductive pillar 15. In some embodiments, the circuit layer 11 is similar to the circuit layer 10, and the descriptions of the circuit layer 10 can be applicable to the circuit layer 11. In some embodiments, the film 16 (e.g., infrared radiation (IR) pass filter film) is disposed on the circuit layer 11. In other embodiments, the film 16 can be omitted depending on different specifications.

The circuit layer 11 has an opening 11 h 1 corresponding to the opening 14 h 1 and an opening 11 h 2 corresponding to the opening 14 h 2. For example, the opening 11 h 1 is over the opening 14 h 1 to expose the light emitting area 12 e of the electronic component 12. For example, the opening 11 h 2 is over the opening 14 h 2 to expose the light detecting area 13 e of the electronic component 13. In some embodiments, a width of the opening 11 h 1 is equal to or greater than the opening 14 h 1, and a width of the opening 11 h 2 is equal to or greater than the opening 14 h 2. Hence, a portion of a top surface of the encapsulant 14 may be exposed from the circuit layer 11 if the width of the opening 11 h 1 (or 11 h 2) is greater than that of the opening 14 h 1 (or 14 h 2).

In some embodiments, a protection layer (e.g., clear molding compound) formed of a light transparent material is disposed on the light emitting area 12 e of the electronic component 12 and the light detecting area 13 e of the electronic component 13. However, this will reduce the light transmittance (e.g., less than 82%). In accordance with the embodiments as illustrated in FIG. 1, the light emitting area 12 e of the electronic component 12 and the light detecting area 13 e are exposed from the encapsulant 14 and the circuit layer 11 (e.g., the light emitting area 12 e and the light detecting area 13 e are uncovered or exposed to air), which can increase the light transmittance (e.g., about 100%).

The conductive pillars 15 (e.g., copper pillars) are disposed on the surface 101 of the circuit layer 10 and electrically connect the circuit layer 11 with the circuit layer 10. For example, the conductive pillars 15 electrically connect the interconnection layer 11 r exposed from the dielectric layer 11 d with the interconnection layer 10 r exposed from the dielectric layer 10 d. The conductive pillars 15 are disposed adjacent to the electronic components 12 and 13. In some embodiments, the height of the conductive pillar 15 is about 240 micrometer.

The electrical contacts 17 (e.g. solder balls) are disposed on the surface 102 of the circuit layer 10 to provide electrical connections between the optical device 1 and external components (e.g. external circuits or circuit boards). In some embodiments, the electrical contacts 17 include a controlled collapse chip connection (C4) bump, a ball grid array (BGA) or a land grid array (LGA). In some embodiments, the electrical contacts 17, the circuit layers 10, 11 and the conductive pillars 15 provide a fan-out structure for the electronic components 12 and 13.

In some embodiments, the circuit layer 10 can be replaced by a substrate, and the electronic components 12 and 13 can be electrically connected to the substrate by wire bonding technique. However, the substrate has a relatively large area and thickness. In addition, an additional space and height are included for wire bonding loops, this would hinder the miniaturization of the optical device. In accordance with the embodiments as shown in FIG. 1, the use of the circuit layer 10 can reduce the area, the thickness and the manufacturing cost of the optical device 1.

FIG. 2 illustrates a cross-sectional view of an optical device 2 in accordance with some embodiments of the present disclosure. The optical device 2 in FIG. 2 is similar to the optical device 1 in FIG. 1 except that in FIG. 2, the electronic components 12 and 13 are replaced by an electronic component 22.

The electronic component 22 is disposed on the circuit layer 10. In some embodiments, a backside surface of the electronic component 22 is attached to the circuit layer 10 through a DAF 22 d. The electronic component 22 has a light detecting area 22 e facing away from the circuit layer 10 and configured to receive or detect a light beam. In some embodiments, the electronic component 22 may be a light detector which may be, e.g., a PIN diode, a photodiode, or a phototransistor. In some embodiments, the optical device 2 is an image sensor or any other sensors including a light detecting component.

FIG. 3 illustrates a cross-sectional view of an optical device 3 in accordance with some embodiments of the present disclosure. The optical device 3 in FIG. 3 is similar to the optical device 2 in FIG. 2, and the differences therebetween are described below.

The optical device 2 in FIG. 2 has the circuit layers 10 and 11 respectively disposed adjacent to the backside surface and the active surface of the electronic component 22 (e.g., on both top and bottom surfaces of the encapsulant 14) while the optical device 3 in FIG. 3 has solely one circuit layer 11 disposed adjacent to the active surface of the electronic component 22 (e.g., selectively on the top surface of the encapsulant 14). As shown in FIG. 3, the conductive pillars 15 penetrate the encapsulant 14 and the dielectric layer 10 d to be electrically connected to the electrical contacts 17.

FIG. 4 illustrates a cross-sectional view of an optical module 4 in accordance with some embodiments of the present disclosure. The optical device 4 includes the optical device 2 as shown in FIG. 2 and a semiconductor device package 4′. In other embodiments, the optical device 2 can be replaced by the optical device 1, 2, 3 or 5 as illustrated in FIG. 1, 2, 3 or 5 or any other optical devices. The semiconductor device package 4′ includes circuit layers 40 and 41, an electronic component 42, a package body 44, conductive pillars 45 and electrical contacts 47.

The circuit layer 40 includes an interconnection layer (e.g., RDL) 40 r and a dielectric layer 40 d. A portion of the interconnection layer 40 r is covered or encapsulated by the dielectric layer 40 d while another portion of the interconnection layer 40 r is exposed from the dielectric layer 40 d to provide electrical connections. In some embodiments, the circuit layer 40 is similar to the circuit layer 10, and the descriptions of the circuit layer 10 can be applicable to the circuit layer 40.

The electronic component 42 is disposed on the circuit layer 10. In some embodiments, a backside surface of the electronic component 42 is attached to the circuit layer 10 through a DAF 42 d. The electronic component 42 has conductive pads 42 c disposed on an active surface of the electronic component 42 to provide electrical connections. Conductive pillars (e.g., copper pillars) 42 p are electrically connected to the conductive pads 42 c of electronic component 42. For example, the conductive pillars 42 p electrically connect the conductive pads 42 c with the circuit layer 41. In some embodiments, the electronic component 42 includes a control circuit or a processing circuit, such as an application-specific integrated circuit (ASIC), a microcontroller unit (MCU), a central processing unit (CPU) or any other controllers (or processors). In some embodiments, the electronic component 42 is electrically connected to the optical device 2 through the circuit layer 41 and configured to control the optical device 2 or to process the data or signal received from the optical device 2.

The package body 44 is disposed on the circuit layer 40 to cover or encapsulate the electronic component 42. In some embodiments, the package body 44 includes an epoxy resin having fillers, a molding compound (e.g., an epoxy molding compound or other molding compound), a polyimide, a phenolic compound or material, a material with a silicone dispersed therein, or a combination thereof.

The circuit layer 41 includes an interconnection layer (e.g., RDL) 41 r and a dielectric layer 41 d. A portion of the interconnection layer 41 r is covered or encapsulated by the dielectric layer 41 d while another portion of the interconnection layer 41 r is exposed from the dielectric layer 41 d to provide electrical connections. In some embodiments, the circuit layer 41 is similar to the circuit layer 11, and the descriptions of the circuit layer 11 can be applicable to the circuit layer 41. The optical device 2 is disposed on the circuit layer 41 and electrically connected to the electronic component 42 through the circuit layer 41 and conductive pillars 42 p.

The conductive pillars 45 (e.g., copper pillars) are disposed on the circuit layer 40 and electrically connect the circuit layer 41 with the circuit layer 40. For example, the conductive pillars 45 electrically connect the interconnection layer 41 r exposed from the dielectric layer 41 d with the interconnection layer 40 r exposed from the dielectric layer 40 d. The conductive pillars 45 are disposed adjacent to the electronic component 42.

The electrical contacts 47 (e.g. solder balls) are disposed on a bottom surface of the circuit layer 10 to provide electrical connections between the optical module 4 and external components (e.g. external circuits or circuit boards). In some embodiments, the electrical contacts 47 include a C4 bump, a BGA or a LGA. In some embodiments, the electrical contacts 47, the circuit layers 40, 41 and the conductive pillars 45 provide a fan-out structure for the electronic component 42.

FIG. 5 illustrates a cross-sectional view of an optical device 5 in accordance with some embodiments of the present disclosure. The optical device 5 includes a circuit layer 50, electronic components 52, 53 a, 53 b, an encapsulant 54, conductive pillars 55, a film 56 and electrical contacts 57.

The electronic component 52 has a light emitting area 52 e facing the circuit layer 10 and configured to emit a light beam toward an object. The light emitting area 52 e is located on or adjacent to a backside surface of the electronic component 52. In some embodiments, the electronic component 52 may be a light emitter or a light emitting device, such as a light-emitting diode (LED) or other light emitting die. For example, the electronic component 52 may include, e.g., an LED, a laser diode, another device that may include one or more semiconductor layers, or a combination of two or more thereof. The semiconductor layers may include silicon, silicon carbide, gallium nitride, or any other semiconductor materials.

The electronic component 52 has conductive pads 52 c 1 and 52 c 2 (e.g., P-terminal and N-terminal) disposed on an active surface of the electronic component 52 to provide electrical connections. As shown in FIG. 5, the conductive pads 52 c 1, 52 c 2 and the light emitting area 52 e are disposed at different surfaces of the electronic component 52. In some embodiments, the conductive pads 52 c 1 and 52 c 2 have different sizes. Conductive pillars (e.g., copper pillars) 52 p are electrically connected to the conductive pads 52 c 1 and 52 c 2 of electronic component 52.

The electronic component 53 a has a light detecting area 53 e facing the circuit layer 10 and configured to receive or detect a light beam reflected from the object. The light detecting area 53 e is located on or adjacent to an active surface of the electronic component 53 a. In some embodiments, the electronic component 53 a may be a light detector which may be, e.g., a PIN diode, a photodiode, or a phototransistor. In some embodiments, the optical device 5 may act as a proximity sensor or any other sensors including a light emitting component and a light detecting component.

The electronic component 53 a has conductive pads 53 ac disposed on the active surface of the electronic component 53 a to provide electrical connections. In some embodiments, the conductive pads 53 ac and the light detecting area 53 e are disposed at or adjacent to the active surface of the electronic component 53 a. The conductive pads 53 ac may disposed adjacent to edges of the active surface of the electronic component 53 a while the light emitting area 53 e may be disposed at or adjacent to the center of the active surface of the electronic component 53 a.

The electronic component 53 b is disposed on the backside surface of the electronic component 53 a. In some embodiments, a backside surface of the electronic component 53 b is attached to the backside surface of the electronic component 53 a through a DAF 53 d. The electronic component 53 b has conductive pads 53 bc disposed on an active surface of the electronic component 53 b to provide electrical connections. Conductive pillars (e.g., copper pillars) 53 p are electrically connected to the conductive pads 53 bc of electronic component 53 b. In some embodiments, the electronic component 53 b includes a control circuit or a processing circuit, such as an ASIC, a MCU, a CPU or any other controllers (or processors).

The circuit layer 50 includes an interconnection layer (e.g., RDL) 50 r and dielectric layers 50 p 1 and 50 p 2. The dielectric layer 50 p 1 covers a portion of the backside surface of the electronic component 52 and exposes the light emitting area 52 e of the electronic component 52. The dielectric layer 50 p 1 covers a portion of the backside surface of the electronic component 52 and exposes the light detecting area 53 e and the conductive pads 53 ac of the electronic component 53 a. A portion of the interconnection layer 50 r is covered or encapsulated by the dielectric layer 50 d 2 while another portion of the interconnection layer 50 r is exposed from the dielectric layer 50 d 2 to provide electrical connections. For example, the interconnection layer 50 r exposed from the dielectric layer 50 d 2 is electrically connected to the electronic component 53 a. For example, the interconnection layer 50 r exposed from the dielectric layer 50 d 2 is in contact with the conductive pads 53 ac of the electronic component 53 a. The conductive pillars 55 (e.g., copper pillars) are electrically connect to the circuit layer 50 (e.g., to the interconnection layer 50 r).

The dielectric layer s 50 p 1 and 50 p 2 have openings 50 h to expose the light emitting area 52 e and the light detecting area 53 e. For example, the light emitting area 52 e and the light detecting area 53 e are uncovered or exposed to air, which can increase the light transmittance (e.g., about 100%). In some embodiments, the circuit layer 50 is similar to the circuit layer 10, and the descriptions of the circuit layer 10 can be applicable to the circuit layer 50. In some embodiments, the film 56 (e.g., IR pass filter film) is disposed on the circuit layer 50. In other embodiments, the film 56 can be omitted depending on different specifications.

The encapsulant 54 covers the electronic components 52, 53 a, 53 b and the conductive pillars 55. The encapsulant 54 is formed of or includes an opaque material or a light absorbing material to avoid the light emitted from the electronic component 52 from directly entering the light detecting area 53 e of the electronic component 53 a. This can mitigate or eliminate the cross-talk issue between the electronic components 52 and 53 a. In some embodiments, the encapsulant 54 may include OD 4 materials, such as black molding compound.

Conductive pads 51 r are electrically connected to the conductive pillars 52 p, 53 p and 55. A dielectric layer 51 p is disposed on a bottom surface of the encapsulant 54. The dielectric layer 51 p covers a portion of the conductive pads 51 r and exposes the other portion of the conductive pads 51 r for electrical connections. The electrical contacts 57 (e.g. solder balls) are disposed on the exposed portion of the conductive pads 51 r to provide electrical connections between the optical device 5 and external components (e.g. external circuits or circuit boards). In some embodiments, the electrical contacts 57 include a C4 bump, a BGA or a LGA.

FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G illustrate a method for manufacturing an optical device according to some embodiments of the present disclosure. In some embodiments, the method illustrated in FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G can be used to manufacture the optical device 1 in FIG. 1. In other embodiments, the method illustrated in FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G can be used to manufacture other optical devices (e.g., the optical device 2, 3 or 4) through some modifications.

Referring to FIG. 6A, a carrier 69 is provided. The carrier 69 may have an adhesive layer (e.g., adhesive film or tape) thereon. The circuit layer 10 including the dielectric layer 10 d and the interconnection layer 10 r is formed on the carrier 69. In some embodiments, the circuit layer 10 can be formed by lithographic techniques. The conductive pillars 15 are formed on the circuit layer 10. The electronic components 12 and 13 are then disposed on the circuit layer 10. In some embodiments, the order for disposing the electronic components 12, 13 and the conductive pillars 15 can be adjusted depending on different design specifications. In some embodiments, backside surfaces of the electronic components 12 and 13 are attached to the circuit layer 10 through DAFs 12 d and 13 d.

The light emitting area 12 e of the electronic component 12 and the light detecting area 13 e of the electronic component 13 face away from the circuit layer 10. The active surfaces of the electronic components 12 and 13 facing away from the circuit layer 10. The conductive pillars 12 p 1 and 12 p 2 are formed on the conductive pads 12 c 1 and 12 c 2 of the electronic component 13. The conductive pillars 13 p 1 and 13 p 2 are formed on the conductive pads 13 c 1 and 13 c 2 of the electronic component 13. In some embodiments, the conductive pillars 12 p 1, 12 p 2, 13 p 1, 13 p 2 and 15 are formed by plating or any other suitable processes.

Referring to FIG. 6B, a protection film 68 a is formed on the light detecting area 13 e of the electronic component 13 and a protection film 68 b is formed on the light emitting area 12 e of the electronic component 13. The protection films 68 a and 68 b fully cover the light detecting area 13 e and the light emitting area 12 e. In some embodiments, the protection films 68 a and 68 b are formed of or include Silicone, Polyurethane (PU), Polydimethylsiloxane (PDMS) or any other suitable materials.

Referring to FIG. 6C, the encapsulant 14 is formed on the circuit layer 10 to cover the electronic components 12, 13, the conductive pillars 12 c 1, 12 c 2, 13 c 1, 13 c 2, 15 and the protection films 68 a, 68 b. In some embodiments, the encapsulant 14 may fully cover the electronic components 12, 13, the conductive pillars 12 c 1, 12 c 2, 13 c 1, 13 c 2, 15 and the protection films 68 a, 68 b, and a portion of the encapsulant 14 is removed by, for example, grinding to expose top portions of the conductive pillars 12 c 1, 12 c 2, 13 c 1, 13 c 2, 15 and the protection films 68 a, 68 b. In some embodiments, the encapsulant 14 may be formed by lamination or molding techniques.

Referring to FIG. 6D, the circuit layer 11 having the interconnection layer 11 r and the dielectric layer 11 d is formed on the encapsulant 14. The interconnection layer 11 r is electrically connected to the exposed portion of the conductive pillars 12 c 1, 12 c 2, 13 c 1, 13 c 2 and 15. The dielectric layer 11 d includes openings 11 h 1 and 11 h 2 to expose the protection films 68 b and 68 a. In some embodiments, the opening 11 h 1 has a width equal to or greater than a width of the protection film 68 b, and the opening 11 h 2 has a width equal to or greater than a width of the protection film 68 a. Hence, a portion of a top surface of the encapsulant 14 may be exposed from the dielectric layer 11 d if the width of the opening 11 h 1 (or 11 h 2) is greater than that of the protection film 68 b (or 68 a). In some embodiments, the circuit layer 11 is formed by lithographic techniques.

Referring to FIG. 6E, the protection films 68 a and 68 b are removed to expose the light detecting area 13 e of the electronic component 13 and the light emitting area 12 e of the electronic component 12. Then, the film (e.g., IR pass filter film) 16 is formed on the circuit layer 11 by, for example, jet-printing or any other suitable processes as shown in FIG. 6F. In some embodiments, the operation in FIG. 6F can be omitted depending on different design specifications.

Referring to FIG. 6G, the carrier 69 (and the adhesive layer) is removed from the circuit layer 10 to expose a portion of the interconnection layer 10 r. The electrical contacts 17 (e.g., solder balls) are disposed on the exposed portion of the interconnection layer 10 r to form the optical device 1 as shown in FIG. 1. In some embodiments, the electrical contacts 17 may be disposed by, for example, ball mount techniques. In some embodiments, singulation may be performed to separate out individual optical devices by, for example, using a dicing saw, laser or other appropriate cutting technique.

In some embodiments, the optical device 2 as shown in FIG. 2 can be manufactured by the operations as shown in FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G, if the electronic components 12 and 13 are replaced by the electronic component 22 in the operation as shown in FIG. 6A. In some embodiments, the optical device 3 as shown in FIG. 3 can be manufactured by the operations as shown in FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G, if the electronic components 12 and 13 are replaced by the electronic component 22 and the operation for forming the interconnection layer 10 r is omitted in the operation as shown in FIG. 6A. In some embodiments, the optical device 4 as shown in FIG. 4 can be manufactured by the operations as shown in FIG. 6A, FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F and FIG. 6G, if the optical device 1 as shown in FIG. 6G is further disposed on the semiconductor device package 4′ as shown in FIG. 4.

FIG. 7A, FIG. 7B, FIG. 7C, FIG. 7D, FIG. 7E, FIG. 7F, FIG. 7G, FIG. 7H and FIG. 7I illustrate a method for manufacturing an optical device according to some embodiments of the present disclosure. In some embodiments, the method illustrated in FIG. 7A, FIG. 7B, FIG. 7C, FIG. 7D, FIG. 7E, FIG. 7F, FIG. 7G, FIG. 7H and FIG. 7I can be used to manufacture the optical device 5 in FIG. 5. In other embodiments, the method illustrated in FIG. 7A, FIG. 7B, FIG. 7C, FIG. 7D, FIG. 7E, FIG. 7F, FIG. 7G, FIG. 7H and FIG. 7I can be used to manufacture other optical devices through some modifications.

Referring to FIG. 7A, a carrier 79 is provided. The carrier 79 may have an adhesive layer 79 h (e.g., adhesive film or tape) thereon. The electronic components 52 and 53 a are then disposed on the adhesive layer 79 h. In some embodiments, the light emitting area 52 e (e.g., the backside surface) of the electronic component 52 and the light detecting area 53 e and the conductive pads 53 ac (e.g., the active surface) of the electronic component 53 face the carrier 79 and are attached to the carrier 79 through the adhesive layer 79 h. The conductive pads 52 c 1 and 52 c 2 (e.g., the active surface) of the electronic component 52 face away from the carrier 79. The electronic component 53 b is then disposed on the electronic component 52 s. In some embodiments, the backside surface of the electronic component 53 b is attached to the backside surface of the electronic component 53 a through the DAF 53 d. The electronic component 53 b has conductive pads (e.g., the active surface) face away from the carrier 79.

Referring to FIG. 7B, the encapsulant 54 is formed on the carrier 79 to cover the electronic components 52, 53 a and 53 b. In some embodiments, the encapsulant 54 may be formed by molding techniques (e.g., transfer molding, compression molding or the like) or any other suitable processes.

Referring to FIG. 7C, openings 54 h 1 are formed to penetrate the encapsulant 54 to expose the conductive pads 52 c 1, 52 c 2, 53 bc of the electronic components 52 and 53 b. The carrier 79 (and the adhesive layer 79 h) is then removed.

Referring to FIG. 7D, the dielectric layer 50 p 1 is formed on the encapsulant 54. Openings 50 ph (e.g., through holes) are formed to penetrate the dielectric layer 50 p 1, and openings 54 h 2 (e.g., through holes) are formed to penetrate the encapsulant 54. The openings 50 ph are connected to the openings 54 h 2. The light detecting area 53 e and the conductive pads 53 ac of the electronic component 53 a and the light emitting area 52 e of the electronic component 52 are exposed from the dielectric layer 50 p 1.

Referring to FIG. 7E, the openings 54 h 1, 54 h 2 and 50 ph are filled with a conductive material to form the conductive pillars 52 p, 53 p and 55. The conductive pillars 52 p are connected to the conductive pads 52 c 1 and 52 c 2 of the electronic component 52. The conductive pillars 53 p are connected to the conductive pads 53 bc of the electronic component 53 b. In some embodiments, the conductive pillars 52 p, 53 p and 55 may be formed by plating or any other suitable processes.

Referring to FIG. 7F, the circuit layer 50 having the interconnection layer 50 r and the dielectric layer 50 p 2 is formed on the dielectric layer 50 p 1. The interconnection layer 50 r is electrically connected to the conductive pads 53 ac of the electronic component 53 a and the conductive pillars 55. The dielectric layer 50 p 2 has openings 50 h to expose the light emitting area 52 e of the electronic component 52 and the light detecting area 53 e of the electronic component 53. In some embodiments, the circuit layer 50 may be formed by lithographic techniques.

Referring to FIG. 7G, the film (e.g., IR pass filter film) 56 is formed on the circuit layer 50 by, for example, jet-printing or any other suitable processes. In some embodiments, the operation in FIG. 7G can be omitted depending on different design specifications.

Referring to FIG. 7H, the dielectric layer 51 p is formed on a surface (facing away from the circuit layer 50) of the encapsulant 54. The dielectric layer 51 p has openings (through holes) to expose a portion of the conductive pillars 52 p, 53 p and 55 for electrical connections.

Referring to FIG. 7I, a conductive material 51 r is formed within the openings of the dielectric layer 51 p to be electrically connect to the exposed portion of the conductive pillars 52 p, 53 p and 55. The conductive material 51 r may be formed by, for example, plating or any other suitable processes. The electrical contacts 57 (e.g., solder balls) are then disposed on the conductive material 51 r to form the optical device 5 as shown in FIG. 5. In some embodiments, the electrical contacts 57 may be disposed by, for example, ball mount techniques. In some embodiments, singulation may be performed to separate out individual optical devices by, for example, using a dicing saw, laser or other appropriate cutting technique.

In the description of some embodiments, a component provided “on” another component can encompass cases where the former component is directly on (e.g., in physical contact with) the latter component, as well as cases where one or more intervening components are located between the former component and the latter component.

In the description of some embodiments, a component characterized as “light transmitting” or “transparent” can refer to such a component as having a light transmittance of at least 80%, such as at least 85% or at least 90%, over a relevant wavelength or a relevant range of wavelengths, such as a peak infrared wavelength or a range of infrared wavelengths emitted by a light emitter. In the description of some embodiments, a component characterized as “light shielding,” “light blocking,” or “opaque” can refer to such a component as having a light transmittance of no greater than 20%, such as no greater than 15% or no greater than 10%, over a relevant wavelength or a relevant range of wavelengths, such as a peak infrared wavelength or a range of infrared wavelengths emitted by a light emitter.

Additionally, amounts, ratios, and other numerical values are sometimes presented herein in a range format. It can be understood that such range formats are used for convenience and brevity, and should be understood flexibly to include not only numerical values explicitly specified as limits of a range, but also all individual numerical values or sub-ranges encompassed within that range as if each numerical value and sub-range is explicitly specified.

As used herein, the terms “approximately,” “substantially,” “substantial” and “about” are used to describe and account for small variations. When used in conjunction with an event or circumstance, the terms can refer to instances in which the event or circumstance occurs precisely as well as instances in which the event or circumstance occurs to a close approximation. For example, when used in conjunction with a numerical value, the terms can refer to a range of variation of less than or equal to ±10% of that numerical value, such as less than or equal to ±5%, less than or equal to ±4%, less than or equal to ±3%, less than or equal to ±2%, less than or equal to ±1%, less than or equal to ±0.5%, less than or equal to ±0.1%, or less than or equal to ±0.05%.

While the present disclosure has been described and illustrated with reference to specific embodiments thereof, these descriptions and illustrations do not limit the present disclosure. It will be clearly understood by those skilled in the art that various changes may be made, and equivalents may be substituted within the embodiments without departing from the true spirit and scope of the present disclosure as defined by the appended claims. The illustrations may not necessarily be drawn to scale. There may be distinctions between the artistic renditions in the present disclosure and the actual apparatus, due to variables in manufacturing processes and such. There may be other embodiments of the present disclosure which are not specifically illustrated. The specification and drawings are to be regarded as illustrative rather than restrictive. Modifications may be made to adapt a particular situation, material, composition of matter, method, or process to the objective, spirit and scope of the present disclosure. All such modifications are intended to be within the scope of the claims appended hereto. While the methods disclosed herein have been described with reference to particular operations performed in a particular order, it should be understood that these operations may be combined, sub-divided, or re-ordered to form an equivalent method without departing from the teachings of the present disclosure. Therefore, unless specifically indicated herein, the order and grouping of the operations are not limitations of the present disclosure. 

1. An optical device, comprising: a first circuit layer having an interconnection layer and a dielectric layer; a light detector disposed on the first circuit layer, the light detector having a light detecting area facing away from the first circuit layer and a backside surface facing the first circuit layer; a first conductive pillar disposed on the first circuit layer and spaced apart from the light detector, the first conductive pillar is electrically connected to the interconnection layer of the first circuit layer; and an encapsulant disposed on the first circuit layer and covering the light detector and the first conductive pillar, wherein the light detector is electrically connected to the interconnection layer of the first circuit layer through the first conductive pillar; and the backside surface of the light detector is exposed from the encapsulant.
 2. The optical device of claim 1, further comprising a second circuit layer having an interconnection layer and a dielectric layer, wherein the second circuit layer is disposed on a surface of the encapsulant facing away from the first circuit layer; the interconnection layer of the second circuit layer is electrically connected to the interconnection layer of the first circuit layer through the first conductive pillar; and the light detector is electrically connected to the first conductive pillar through the interconnection layer of the second circuit layer.
 3. The optical device of claim 2, further comprising a second conductive pillar disposed on a conductive pad of the light detector, wherein the conductive pad is disposed on an active surface of the light detector.
 4. The optical device of claim 2, wherein the encapsulant has a first opening to expose the light detecting area; and the dielectric layer of the second circuit layer has a second opening connecting to the first opening to expose the light detecting area.
 5. The optical device of claim 4, wherein a width of the first opening is equal to or greater than a width of the light detecting area; and a width of the second opening is equal to or greater than the width of the first opening.
 6. The optical device of claim 2, further comprising a light emitting device disposed on the first circuit layer and spaced apart from the light detector, wherein the light emitting device has a light emitting area facing away from the first circuit layer and a backside surface facing the first circuit layer.
 7. The optical device of claim 6, further comprising: a second conductive pillar electrically connecting a first conductive pad of the light emitting device with the interconnection layer of the second circuit layer; and a third conductive pillar electrically connecting a second conductive pad of the light emitting device with the interconnection layer of the second circuit layer, wherein a height of the second conductive pillar is different from a height of the third conductive pillar; the light emitting area is located between the first conductive pad and the second conductive pad; and the first conductive pad and the second conductive pad are at different levels.
 8. The optical device of claim 6, wherein the encapsulant has a first opening to expose the light emitting area; and the dielectric layer of the second circuit layer has a second opening connecting to the first opening to expose the light emitting area.
 9. The optical device of claim 8, wherein a width of the first opening is equal to or greater than a width of the light emitting area; and a width of the second opening is equal to or greater than the width of the first opening.
 10. The optical device of claim 2, further comprising a film disposed on the second circuit layer.
 11. The optical device of claim 1, further comprising a die attach film in contact with the backside surface of the light detector and the first circuit layer.
 12. The optical device of claim 1, wherein the encapsulant comprises an opaque material or a light absorbing material.
 13. The optical device of claim 1, wherein the light detecting area is exposed to air.
 14. The optical device of claim 1, further comprising a semiconductor device package having a controller, wherein the optical device is disposed on the semiconductor device package and electrically connected to the semiconductor device package.
 15. An optical device, comprising: a circuit layer having an interconnection layer and a first dielectric layer; a light detector disposed on the circuit layer and electrically connected to the interconnect layer of the circuit layer, the light detector having an active surface facing the circuit layer and a backside surface opposite to the active surface, the light detector having a light detecting area adjacent to the active surface; a controller having an active surface facing away from the circuit layer and a backside surface disposed on the backside surface of the light detector; and an encapsulant disposed on the circuit layer and covering the light detector and the controller.
 16. The optical device of claim 15, further comprising: a second dielectric layer disposed on a surface of the encapsulant facing away from the circuit layer; a first conductive via penetrating the second dielectric layer; a first conductive pillar disposed on the circuit layer and electrically connecting the interconnection layer of the circuit layer with the first conductive via; a second conductive via penetrating the second dielectric layer; and a second conductive pillar electrically connecting the controller with the second conductive via.
 17. The optical device of claim 16, further comprising: a light emitting device disposed on the circuit layer; a third conductive via penetrating the second dielectric layer; and a third pillar electrically connecting the light emitting device with the third conductive via, wherein the light emitting device has an active surface facing away from the circuit layer and a backside surface facing the circuit layer; and the light emitting device has a light emitting area adjacent to the backside surface of the light emitting device.
 18. The optical device of claim 17, wherein the first dielectric layer of the circuit layer has a first opening to expose the light emitting area of the light emitting device.
 19. The optical device of claim 15, wherein the first dielectric layer of the circuit layer has a second opening to expose the light detecting area of the light detector.
 20. (canceled)
 21. (canceled)
 22. (canceled)
 23. (canceled)
 24. (canceled)
 25. (canceled)
 26. The optical device of claim 6, wherein the light detecting area and the light emitting area are exposed to air.
 27. The optical device of claim 6, wherein the light emitting device is electrically connected to the interconnection layer of the first circuit layer through the first conductive pillar.
 28. The optical device of claim 7, wherein the encapsulant has a first opening to expose the light emitting area and surrounds the second conductive pillar and the third conductive pillar.
 29. The optical device of claim 1, further comprising a semiconductor device package disposed adjacent to the first circuit layer and facing the backside surface of the light detector, wherein the semiconductor device package electrically connects to the first circuit layer.
 30. The optical device of claim 29, wherein the semiconductor device package comprises: a third circuit layer; a controller having an active surface facing away from the third circuit layer and a backside surface facing the third circuit layer; and a fourth circuit layer disposed facing the active surface of the controller, wherein the controller electrically connects to the first circuit layer through the fourth circuit layer.
 31. The optical device of claim 30, wherein the semiconductor device package further comprises a fourth conductive pillar disposed adjacent to the third circuit layer, wherein the fourth conductive pillar electrically connects the third circuit layer to the fourth circuit layer. 